Reflectance measurements and optical constants in the Extreme Ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg2Si, and InSb, and evaporated Cr
Juan I. Larruquert and Ritva A. M. Keski-Kuha
Preservation of far-UV aluminum reflectance by means of overcoating with C60 films
José A. Méndez, Juan I. Larruquert and José A. Aznárez
Reflectance measurements and optical constants in the extreme ultraviolet of thin films of ion-beam-deposited Carbon
Juan I Larruquert, Ritva A.M. Keski-Kuha
Optical properties of hot-pressed B4C in the EUV
Juan I. Larruquert and Ritva A. M. Keski-Kuha