por LARRUQUERT | Abr 29, 2009 | articles-2009
M. Vidal-Dasilva; M. Fernández-Perea; J. I. Larruquert; J. A. Méndez; J. A. Aznárez Abstract The spectral range of 50 to 115 nm in the extreme ultraviolet (EUV) is characterized by the high absorption and low normal incidence reflectance of most materials, which make...
por LARRUQUERT | Abr 28, 2009 | articles-2009, OpticalConstants-Lanthanides
Manuela Vidal-Dasilva, Mónica Fernández-Perea, José A. Aznárez, Juan I. Larruquert, José A. Méndez, Luca Poletto, A. Marco Malvezzi, Angelo Giglia, and Stefano Nannarone Abstract The optical constants of thulium (Tm) films were obtained in the 2.75–1600 eV range from...
por LARRUQUERT | Abr 28, 2009 | articles-2009, OpticalConstants-Oxides
Mónica Fernández-Perea, Manuela Vidal-Dasilva, Juan I. Larruquert, José A. Aznárez, José A. Méndez, Eric Gullikson, Andy Aquila, and Regina Soufli Abstract The transmittance of silicon monoxide films prepared by thermal evaporation was measured from 7.1 to 800 eV and...
por LARRUQUERT | Abr 28, 2009 | articles-2009, Broadband EUV mirrors
Mónica Fernández-Perea, José A. Méndez, José A. Aznárez, and Juan I. Larruquert Abstract The reflectance of freshly deposited SiC thin films is measured in situ for what we believe is the first time. SiC was deposited by means of ion-beam sputtering. Reflectance was...
por LARRUQUERT | Abr 28, 2009 | articles-2009
Manuela Vidal-Dasilva, Mónica Fernández-Perea, José A. Méndez, José A. Aznárez, and Juan I. Larruquert Abstract A new type of multilayer coatings with narrowband reflection properties and peaked in the ~50– 92 nm spectral range has been developed. Multilayers are...
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