por LARRUQUERT | Abr 28, 2013 | articles-2013, OpticalConstants-Carbon
J. I. Larruquert, L. V. Rodríguez-de Marcos, J. A. Méndez, P. J. Martin, and A. Bendavid Abstract Abstract: The extreme ultraviolet (EUV) reflectance of amorphous tetrahedrally coordinated carbon films (ta-C) prepared by filtered cathodic vacuum arc was measured in...
por LARRUQUERT | Abr 28, 2012 | articles-2012, OpticalConstants-Carbon
Juan I. Larruquert, Antonio P. Pérez-Marín, Sergio García-Cortés, Luis Rodríguez-de Marcos, José A. Aznárez, and José A. Méndez Abstract The optical constants of ion-beam-sputtered B4C films have been measured by ellipsometry in the 190–950 nm range. The set of data...
por LARRUQUERT | Abr 28, 2011 | articles-2011, OpticalConstants-Carbon
Juan I. Larruquert, Antonio P. Pérez-Marín, Sergio García-Cortés, Luis Rodríguez-de Marcos, José A. Aznárez, and José A. Méndez Abstract The optical constants of ion-beam-sputtered SiC films have been measured by ellipsometry in the 190 to 950 nm range. The set of...
por LARRUQUERT | Abr 28, 2007 | articles-2007, Coatings Design - Modified optical-constant models, OpticalConstants-Carbon
Mónica Fernández-Perea, Juan I. Larruquert, José A. Aznárez, José A. Méndez, Manuela Vidal-Dasilva, Eric Gullikson, Andy Aquila, Regina Soufli, and J. L. G. Fierro Abstract The optical constants of electron-beam evaporated boron from 6.8 to 900eV were calculated...
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