por Javier Renau López | Abr 12, 2013 | articles-2013
Luis Rodríguez-de Marcos, Juan I. Larruquert, José A. Aznárez, Mónica Fernández-Perea, Regina Soufli, José A. Méndez, Sherry L. Baker, and Eric M. Gullikson Abstract The transmittance and the optical constants of SrF2 thin films, a candidate material for multilayer...
por Javier Renau López | Abr 29, 2000 | articles-2000
José A. Méndez, Juan I. Larruquert, and José A. Aznárez Abstract Thin films of C60 were investigated as protective coatings of Al films to preserve their far-UV (FUV) reflectance by inhibition or retardation of their oxidation. Two methods were used for the...
por Javier Renau López | May 12, 1996 | articles-1996
J. I. Larruquert, J. A. Méndez, and J. A. Aznárez Abstract Measurements of the extreme ultraviolet (EUV) reflectance of unoxidized aluminum films versus the angle of incidence in the interval of 82–77 nm, just below the aluminum plasma wavelength (83 nm), are...
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